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IBM Research

Tak Ning

IBM Fellow


 


Tak H. Ning received his Ph.D. degree in physics from the University of Illinois at Urbana-Champaign in 1971. Prior to joining IBM at Thomas J. Watson Research Center in 1973, he was a research assistant professor at the University of Illinois. At Illinois, he did research on the theory of impurity centers in silicon, the transport of electrons in MOS surface inversion layers, and developed a theory for the oxide-charge scattering of electrons in MOS inversion layers.

During the early part of his IBM career, Tak and his colleagues made significant contributions to the understanding of hot-electron effects and electron and hole trapping in MOSFET’s, including the discovery and modeling of substrate-hot-electron effects. They demonstrated the shallow-emitter effect and its dependence on emitter-contact material. They invented and developed the polysilicon-emitter self-aligned bipolar transistor, which is the basis of all modern bipolar transistor technology. They also invented the substrate-plate trench-capacitor DRAM cell, which is widely used in stand-alone and embedded DRAM products. As senior manager of the silicon device technology department between 1982 and 1991, he directed and contributed to the development of submicron bipolar and CMOS technologies in IBM Research as well as led his team in exploring SOI and EEPROM devices.

In 1991, Tak was appointed an IBM Fellow. Since then, he has focused much of his technical work on understanding the limits of CMOS and exploring the opportunities in silicon technology beyond CMOS. He also represents IBM at the Executive Advisory Board of the Semiconductor Research Corporation (a consortium of semiconductor companies funding university research in semiconductors).

Tak has participated in many IEEE and professional society activities, including serving as an associated editor of the IEEE Transactions on Electron Devices, a member of the Administrative Committee of the IEEE Electron Device Society, a program committee member of several technical conferences, and a member or chair of several IEEE award committees, including the IEEE Fellow Committee. He has been a member of the committee that publishes the International Technology Roadmap for Semiconductors since 1992.

Tak has authored or co-authored about 120 technical papers and 30 U.S. patents. He co-authored (with Yuan Taur) a book titled Fundamentals of Modern VLSI Devices, which has been adopted as a graduate text by many universities worldwide and translated into Japanese. He is a fellow of the American Physical Society and of the IEEE, and a member of the US National Academy of Engineering. He received several awards, including the IEEE Electron Device Society 1989 J.J. Ebers Award, the IEEE 1991 Jack A. Morton Award, the 1998 Pan Wen-Yuan Foundation (Taiwan) Outstanding Research Award, and the IEEE 2000 Custom Integrated Circuits Conference Best Paper Award.

 
 


Tak Ning



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