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Sub-Angstrom resolution: 90 degree partial dislocation structure


 


Sub-Angstrom resolution: 90 degree partial dislocation structure
On the left: Model calculation showing a proposed structure for an important defect in the silicon crystal, viewed using a 2 Angstrom (0.2 nanometers) resolution. Atom columns are indicated by the dots. Near neighbor connectivity of the atoms is indicated by the lines. Bright areas indicate strong scattering of the 2 Angstrom electron beam.

On the right: The same structure viewed with a 1 Angstrom diameter beam. Details in the four column group (red) will become apparent.
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