Publications

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  • ACM Papers - Copyright © by Association for Computing Machinery, Inc. Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage. To copy otherwise, to republish, to post of servers, or to redistribute to lists, requires prior specific permission and/or a fee.
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The Physical Design of the POWER6 Microprocessor

  • "The Physical Design of the POWER6 Microprocessor," Joshua Friedrich, Bradley McCredie, Norman James, Bill Huott, Brian Curran, Eric Fluhr, Gauray Mittal, Eddie Chan, Yuen Chan, Donald Plass, Sam Chu, Hung Le, Leo Clark, John Ripley, Scott Taylor, Jack DiLullo, Mary Lanzerotti, Proceedings of the International Solid-State Circuits Conference (ISSCC), San Francisco, CA, Feb. 11-15, 2007. PDF.

    • Rent's rule for ultralarge-scale integrated circuitry and applications

  • "Impact of Interconnect Length Changes on Effective Materials Properties (Dielectric Constant)," M. Y. Lanzerotti, G. Fiorenza, R. A. Rand, Proceedings of the Workshop on System-Level Interconnect Prediction (SLIP), Austin, TX, March 17-18, 2007. PDF.

  • "Microminiature packaging and integrated circuitry: The work of E. F. Rent, with an application to on-chip interconnection requirements," M. Y. Lanzerotti, G. Fiorenza, R. A. Rand, IBM J. Res. Dev., vol. 49, pp. 777-803, Sept. 2005. PDF

  • "Interpretation of Rent's rule for ultralarge-scale integrated circuit designs, with an application to wirelength distribution models," M. Y. Lanzerotti, G. Fiorenza, R. A. Rand, IEEE Transactions on VLSI Design, vol. 12, pp. 1330-1347, Dec. 2004. PDF

    • On-chip interconnect requirements

  • "Characterization of the impact of interconnect design on the capacitive load driven by a global clock distribution," G. G. Lopez, G. Fiorenza, T. Bucelot, P. Restle, M. Y. Lanzerotti, Proceedings of the 2005 ACM Great Lakes Symposium on VLSI (GLSVLSI), Chicago, IL, pp. 38-43, April 17-19, 2005.PDF

  • "Predicting interconnect requirements in ultra-large-scale integrated control logic circuitry," Proceedings of the Workshop on System-Level Interconnect Prediction, San Francisco, CA, pp. 43-50, April 2-3, 2005. PDF

  • "Assessment of on-chip wire-length distribution models," M. Y. Lanzerotti, G. Fiorenza, R. A. Rand, IEEE Transactions on VLSI Design, vol. 12, pp. 1108-1112, Oct. 2004. PDF

  • "Circuit and wire contributions to clock power in Server Group microprocessor designs," G. G. Lopez, G. Fiorenza, T. Bucelot, P. Restle, M. Y. Lanzerotti, IBM Austin Conference on Energy-Efficient Design, Mar. 2004. abstract pdf

    • Statistical models for the VLSI route problem

  • "Estimating the efficiency of collaborative problem-solving, with applications to chip design," M. Y. Lanzerotti Wisniewski, E. Yashchin, R. L. Franch, D. P. Conrady, G. Fiorenza, I. C. Noyan, American Statistical Association Section on Quality and Productivity, pp. 4861-4866 (2003). PDF

  • "The physical design of on-chip interconnections," M. Y. Lanzerotti Wisniewski, E. Yashchin, R. L. Franch, D. P. Conrady, G. Fiorenza, I. C. Noyan, IEEE Transactions on Computer-Aided Design, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 22, 254-276 (2003). PDF

  • "Estimating the efficiency of collaborative problem-solving, with applications to chip design," M. Y. Lanzerotti Wisniewski, E. Yashchin, R. L. Franch, D. P. Conrady, G. Fiorenza, and I. C. Noyan, IBM J. Res. Dev 47, 77 (2003). PDF

    • Non-linear and quantum optics

  • "Measurements of Quantum Noise in Optical Phase Conjugation via Four-Wave Mixing in an Atomic Vapor," M. Y. Lanzerotti, R. W. Schirmer, A. L. Gaeta, and G. S. Agarwal, Phys. Rev. A 60, 4980 (1999). PDF

  • "Quantum Theory of Noise in Phase Conjugation by Backward Four-Wave Mixing in an Atomic Vapor," R. W. Schirmer, M. Y. Lanzerotti, A. L. Gaeta, and G. S. Agarwal, Phys. Rev. A 55, 3155 (1997). PDF

  • "Phase Conjugation of Weak Continuous-Wave Optical Signals," M. Y. Lanzerotti, R. W. Schirmer, A. L. Gaeta, G. S. Agarwal, Phys. Rev. Lett. 77, 2202 (1996). PDF

  • "High-Reflectivity, Wide-Bandwidth Optical Phase Conjugation via Four-Wave Mixing in Potassium Vapor," M. Y. Lanzerotti, R. W. Schirmer, A. L. Gaeta, Appl. Phys. Lett. 69, 1199 (1996). PDF

  • "Quantum Noise in Optical Phase Conjugation Performed in an Atomic Vapor," M. Y. Lanzerotti, R. W. Schirmer, A. L. Gaeta, and G. S. Agarwal, in Proc. 7th Rochester Conference on Coherence and Quantum Optics, J. H. Eberly, L. Mandel, and E. Wolf, eds., Plenum Press (1996).

  • "Optical phase conjugation with very weak continuous-wave signals," M. Y. Lanzerotti, R. W. Schirmer, and A. L. Gaeta, in Proc. Quantum Electronics and Laser Science Conference(QELS), QFB7 (1996). PDF

  • "Theory of Quantum Optical Measurements with a Phase-Conjugate Mirror," M. Y. Lanzerotti, A. L. Gaeta, Phys. Rev. A 51, 4057 (1995).

  • "Optical Phase Conjugation of Nonclassical Fields," M. Y. Lanzerotti, A. L. Gaeta, and R. W. Boyd, Phys. Rev. A 51, 3182 (1995).

    • Low-temperature physics

  • "The Onset of Superfluidity in 4He Films Adsorbed in Aerogel Glass," P. A. Crowell, M. Y. Lanzerotti, and J. D. Reppy, J. Low Temp. Phys. 89, 629 (1992).

    • Electron microscopy

  • "Incoherence Effects in Reflection Electron Microscopy," A. Howie, M. Y. Lanzerotti, and Z. L. Wang, Microsc. Microanal. Microstruct. 3, 233 (1992).

  • "Convergent Beam RHEED of GaAs(110) in a STEM: Theory and Experiment," A. L. Bleloch, A. Howie, and M. Y. Lanzerotti, Proc. 12th International Congress for Electron Microscopy, San Francisco Press, 1990.

  • "Silicon Oxidation studied by in-situ TEM, " J. M. Gibson and M. Y. Lanzerotti. Ultramicroscopy 31, 29 (1989).

  • "Plan-view Transmission Electron Diffraction Measurement of Roughness at Buried Si/SiO2 Interfaces," J. M. Gibson, M. Y. Lanzerotti, and V. Elser, Appl. Phys. Lett. 55, 1394 (1989).

  • "Observation of Interfacial Atomic Steps During Silicon Oxidation," J. M. Gibson and M. Y. Lanzerotti, Nature 340, 128 (1989).

  • "In-situ Studies of Silicon Oxidation," J. M. Gibson and M. Y. Lanzerotti, Mat. Res. Soc. Symp. Proc. 139, 67 (1989).

  • "A Novel Method for Study of Roughness at Buried Interfaces by Plan View TEM: Si/SiO2, " J. M. Gibson and M. Y. Lanzerotti, Mat. Res. Soc. 355 (1989).

  • "TEM of in-situ Deposited Films on Silicon," J. M. Gibson, J. L. Batstone, and M. Y. Lanzerotti, Proc. NATO Adv. Res. Workshop 295 (1989).

    • Atomic physics

  • "Slow Proton Emission from Noble Gas Solids," A. P. Mills, Jr., M. Leventhal, M. Y. Lanzerotti, D. M. Zuckerman, E. M. Gullikson, and G. R. Brandes, Phys. Rev. B. 42, 5973 (1990).