Philip E. Batson
received the Ph.D. in Applied Physics from
Cornell
University
in 1976 under the direction of
Professor John Silcox.After two years as a Research Fellow for GlasgowUniversity, based at the Cavendish
Laboratory in Cambridge, England, he began employment as a
Research Staff Member at IBMThomasJ.WatsonResearchCenter, where he continues today.His main interests have been in the area of
spatially resolved Electron Energy Loss Spectroscopy (EELS) using the
Scanning Transmission Electron Microscope (STEM). This work included the
design and fabrication of a high resolution electron spectrometer for use
with the STEM, experiments in nanometer-sized structures to investigate characteristics
of the new scattering geometry, new theoretical treatments to understand the
results, and application of this understanding to materials systems: Ge-Si alloys and Sinanoparticles. More recently, he has been involved in
aberration correction in the STEM, helping to demonstrate a sub-Angstrom beam
size for the first time.For this work
he received the 2002-2003 Scientific American 50 Award for Leadership in
Imaging Sciences. He has been a Fellow of the American Physical Society since
1996, and is the author of about 160 publications.
