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IBM Journal of Research and Development  
Volume 30, Number 4, Page 355 (1986)
Scanning Tunneling Microscopy I
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Scanning tunneling microscopy

by G. Binnig, H. Rohrer
Presented here is an overview of the present status and future prospects of scanning tunneling microscopy. Topics covered include the physical basis of the scanning tunneling microscope, its instrumentation aspects, and its use for structural and spectroscopic imaging—on a scale which extends to atomic dimensions. Associated experimental and theoretical studies are reviewed, including several which suggest potential applicability of this new type of microscope to a relatively broad range of biological, chemical, and technological areas.
Related Subjects: Image processing; Materials; Mechanical design; Physics, solid state; Scanning tunneling microscopy; Surface science