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Semiconductor technology
	2006	Continuous MOSFET performance increase with device scaling: The role of strain and channel material innovations
	2006	Optimizing CMOS technology for maximum performance
	2006	Ultralow-voltage, minimum-energy CMOS
	2003	SiON high-refractive-index waveguide and planar lightwave circuits
	2000	Low-temperature Si and Si:Ge epitaxy by ultrahigh vacuum/chemical vapor deposition: Process fundamentals
	2000	The future of CMOS technology
	1999	Cost-effective cleaning and high-quality thin gate oxides
	1999	Modeling and simulation methods for plasma processing
	1999	Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations
	1999	Plasma-assisted chemical vapor deposition of dielectric thin films for ULSI semiconductor circuits
	1999	Plasma-assisted oxidation, anodization, and nitridation of silicon
	1999	Plasma-etching processes for ULSI semiconductor circuits
	1999	Plasma processing damage in etching and deposition
	1999	Sputter deposition for semiconductor manufacturing
	1995	A 64Kb × 32 DRAM for graphics applications
	1995	A low-noise TTL-compatible CMOS off-chip driver circuit
	1995	CMOS circuits for Gb/s serial data communication
	1995	Custom design of CMOS low-power high-performance digital signal-processing macro for hard-disk-drive applications
	1995	Design at the system level with VLSI CMOS
	1995	Digital delay line clock shapers and multipliers
	1995	Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines
	1995	Interconnect fabrication processes and the development of low-cost wiring for CMOS products
	1995	Low-temperature chemical vapor deposition processes and dielectrics for microelectronic circuit manufacturing at IBM
	1995	Multipurpose DRAM architecture for optimal power, performance, and product flexibility
	1995	Overview of gate linewidth control in the manufacture of CMOS logic chips
	1995	Performance of fiber-optic data links using 670-nm cw VCSELs and a monolithic Si photodetector and CMOS preamplifier
	1995	Silicides and local interconnections for high-performance VLSI applications
	1995	The evolution of IBM CMOS DRAM technology
	1995	VLSI on-chip interconnection performance simulations and measurements
	1993	Flexible simulation of a complex semiconductor manufacturing line using a rule-based system
	1992	A single-chip IBM System/390 floating-point processor in CMOS
	1992	Advancing the state of the art in high-performance logic and array technology
	1992	Directory and Trace memory chip with active discharge cell
	1992	Reactive ion etching technology in thin-film-transistor processing
	1992	Unique design concepts in GF11 and their impact on performance
	1991	A 128Kb CMOS static random-access memory
	1991	A 3072 × 32-stage TDI imaging device
	1991	An adder design optimized for DCS logic
	1991	Differential current switch-High performance at low power
	1991	Visual interpretation of multidimensional computations and transistor design
	1991	Visualization in a VLSI design automation system
	1990	Low-temperature Si and Si:Ge epitaxy by ultrahigh-vacuum/chemical vapor deposition: Process fundamentals
	1990	Selective epitaxial growth of silicon and some potential applications
	1988	Physical limits to the useful packaging density of electronic systems
	1988	The kinetics of fast steps on crystal surfaces and its application to the molecular beam epitaxy of silicon
	1987	Contact metallurgy development for VLSI logic
	1987	Correlation analysis of particle clusters on integrated circuit wafers
	1987	Electrical and microstructural investigation of polysilicon emitter contacts for high-performance bipolar VLSI
	1987	Study of contact and shallow junction characteristics in submicron CMOS with self-aligned titanium silicide
	1986	On yield, fault distributions, and clustering of particles
	1985	Advanced bipolar transistor modeling: Process and device simulation tools for today's technology
	1985	An experimental comparison of the head/disk interface dynamics in 5¼- and 8-inch disk drives
	1985	Animation and 3D color display of multiple-variable data: Application to semiconductor design
	1985	FEDSS—A 2D semiconductor fabrication process simulator
	1985	Semiconductor device simulation using generalized mobility models
	1985	The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributions
	1985	The generation of three-dimensional bipolar transistor models for circuit analysis
	1985	Two-dimensional device simulation program: 2DP
	1985	Two-dimensional process modeling: A description of the SAFEPRO program
	1985	VLSI wiring capacitance
	1984	Modeling of defects in integrated circuit photolithographic patterns
	1984	Resist profile control in E-beam lithography
	1982	Modification of Semiconductor Device Characteristics by Lasers
	1982	Optimization of Plasma Processing for Silicon-Gate FET Manufacturing Applications
	1982	Oxygen Incorporation and Precipitation in Czochralski-Grown Silicon
	1982	Process Control of the Chlorobenzene Single-Step Liftoff Process with a Diazo-Type Resist
	1982	The Mechanism of Single-Step Liftoff with Chlorobenzene in a Diazo-Type Resist
	1981	A Magnetic Sensor Utilizing an Avalanching Semiconductor Device
	1981	Semiconductor Analysis Using Finite Elements—Part I: Computational Aspects
	1981	Semiconductor Logic Technology in IBM
	1981	Semiconductor Manufacturing in IBM, 1957 to the Present: A Perspective
	1981	Semiconductors at IBM: Physics, Novel Devices, and Materials Science
	1981	Solid State Memory Development in IBM
	1981	Statistics of Breakdown
	1980	1/N Circuit and Device Technology
	1980	A 256K-Bit Charge-Coupled Device Memory
	1980	A 64K FET Dynamic Random Access Memory: Design Considerations and Description
	1980	A Charge Injection Transistor Memory Cell
	1980	A Contactless Method for High-Sensitivity Measurement of p-n Junction Leakage
	1980	A One-Device Memory Cell Using a Single Layer of Polysilicon and a Self-Registering Metal-to-Polysilicon Contact
	1980	A Silicon and Aluminum Dynamic Memory Technology
	1980	Circuit Implementation of Fusible Redundant Addresses on RAMs for Productivity Enhancement
	1980	Cross-Coupled Charge-Transfer Sense Amplifier and Latch Sense Scheme for High-Density FET Memories
	1980	Defect-Related Breakdown and Conduction in SiO2
	1980	Implanted Source/Drain Junctions for Polysilicon Gate Technologies
	1980	Near-Ideal Si–SiO2 Interfaces
	1980	Reduction of Leakage by Implantation Gettering in VLSI Circuits
	1980	Registration Mark Detection for Electron-Beam Lithography—EL1 System
	1980	Reliability of SiO2 Gate Dielectric with Semi-Recessed Oxide Isolation
	1980	Silicon Torsional Scanning Mirror
	1980	Single-Step Optical Lift-Off Process
	1980	VLSI Device Phenomena in Dynamic Memory and Their Application to Technology Development and Device Design
	1980	Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product
	1979	GaAs/(GaAl)As Laser Technology
	1979	Geometry Effects of Small MOSFET Devices
	1979	Some Chemical Aspects of the Fluorocarbon Plasma Etching of Silicon and Its Compounds
	1979	Stability of Lateral pnp Transistors During Accelerated Aging
	1979	Tunnels in Semiconductor Epitaxy
	1978	Calculations of the Effect of Emitter Compensation on β and fT of Bipolar Devices
	1978	Characterization of Electron Traps in Aluminum-Implanted SiO2
	1978	Electronic Properties of (100) Surfaces of GaSb and InAs and Their Alloys with GaAs
	1978	Growth of Polycrystalline GaAs for Solar Cell Applications
	1978	Location of Trapped Charge in Aluminum-Implanted SiO2
	1978	Low Cost Silicon for Solar Energy Conversion Applications
	1978	Novel Materials and Devices for Sunlight Concentrating Systems
	1978	Variational Principles for Semiconductor Device Modeling with Finite Elements
	1978	X-Ray Photoelectron Spectroscopy of SiO2–Si Interfacial Regions: Ultrathin Oxide Films
	1973	Digital-to-analog Converter having Common-mode Isolation and Differential Output
	1961	Theoretical Current Multiplication of a Cylindrical Hook Collector
Semiconductors
Semiconductors, III-V
Semiconductors, organic
Semimetals
Servers
Signal processing
Signature verification
Silicides
Silicon
Silicon-germanium
Silicon-on-insulator (SOI)
Silicon Carbide
Silicon dioxide
Silicon nitride
Silicon oxidation
Silver
Simulation
Simultaneous multithreading (SMT)
Soft errors
Software reliability
Solar cells
Solar energy
Solder ball connect (SBC) technology
Solid-state files
Solid logic technology
Solid modeling
Space-related technology
Spectroscopy
Speech processing
Spintronics
Sputtering
Statistical mechanics
Statistics
Stimulated emission
Storage hierarchies
Storage (computer) devices and systems
Supercomputing
Superconductivity
Superconductivity, high-Tc
Superlattices
Surface effects
Surface passivation
Surface science
Switches
Switching circuits
System-on-a-chip (SoC)
Tantalum
Teleconferencing
Telephony
Test-pattern generation
Testing
Testing, AC
Testing, analog signal
Testing, chip
Testing, circuit
Testing, electron-beam/ion probes
Testing, field
Testing, mixed-signal
Testing, module
Testing, optical probes
Testing, random-pattern logic
Text processing
Thermal conduction module (TCM)
Thermodynamics
Thickness measurement
Time-sharing, applications
Tin
Topology
Transistors
Transistors, bipolar
Transistors, organic thin film (OTFTs)
Transistors, thin film (TFTs)
Transmission lines
Tribology
Tunneling
Typewriter design
Ultrasonics
Vanadium
Vatican Library
Vector processing
Verification
Vibration
Video signals
Virtual machines
Virtual reality
Virtualization
Visualization
VLSI
Vocoders
Wave propagation
Wear
Web services
X-ray diffraction
X-ray technology
Zinc
(No Subject)