IBM Journal of Research and Development
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Related Papers
2005Electrochemical planarization of interconnect metallization
2005Multiscale simulations of copper electrodeposition onto a resistive substrate
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2002Reliability limits for the gate insulator in CMOS technology
2000The future of interconnection technology
1998Damascene copper electroplating for chip interconnections
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1998Electrolessly deposited diffusion barriers for microelectronics
1998Metallization by plating for high-performance multichip modules
1998Thin-film multichip module packages for high-end IBM servers
1994Modeling the thermal-to-plasma transitions for Cu photoablation
1993Electroless plating of copper at a low pH level
1993Mechanistic insights into metal-mediated electroless copper plating employing hypophosphite as a reducing agent
1963Prenucleation of Lead Films with Copper, Gold, and Silver
1959Interatomic-Force Constants from a Central-Force Law