2000 | Magnetic thin films in recording technology |
2000 | Nanosecond switching in thin magnetic films |
1999 | Fabrication of magnetic recording heads and dry etching of head materials |
1999 | Growth and characterization of ultrathin nitrided silicon oxide films |
1999 | Modeling and characterization of quantization, polysilicon depletion, and direct tunneling effects in MOSFETs with ultrathin oxides |
1999 | Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations |
1999 | Plasma-assisted chemical vapor deposition of dielectric thin films for ULSI semiconductor circuits |
1999 | Plasma-etching processes for ULSI semiconductor circuits |
1999 | Scaling the gate dielectric: Materials, integration, and reliability |
1999 | Surface science issues in plasma etching |
1999 | Ultrathin nitrided gate dielectrics: Plasma processing, chemical characterization, performance, and reliability |
1999 | (Ba,Sr)TiO3 dielectrics for future stacked- capacitor DRAM |
1998 | Application of cross-sectional transmission electron microscopy to thin-film-transistor failure analysis |
1996 | Thin-film inductive heads |
1996 | Thin-film mediaCurrent and future technology |
1990 | A simple finite element model for reactive sputter-deposition systems |
1990 | Finite element analysis of planar stress anisotropy and thermal behavior in thin films |
1990 | Magnetic multilayer structures |
1990 | Magnetic thin films in recording technology |
1989 | Order in the domain structure in soft-magnetic thin-film elements: A review |
1988 | Characterization of PdSn catalysts for electroless metal deposition |
1988 | Chemistry at interfaces: Electropositive metals on polymer surfaces |
1988 | Delocalized bonding at the metalpolymer interface |
1988 | Developer-induced debonding of photoresist from copper |
1988 | Improvement of adhesion of copper on polyimide by reactive ion-beam etching |
1988 | Surface analysis and characterization of large printed-circuit-board circuitization process steps |
1987 | Delamination and fracture of thin films |
1987 | Oxidation of Si-rich chemical-vapor-deposited films of tungsten silicide |
1986 | Application to biology and technology of the scanning tunneling microscope operated in air at ambient pressure |
1986 | Applications of a high-stability scanning tunneling microscope |
1986 | Chemical applications of scanning tunneling microscopy |
1986 | Construction of a UHV scanning tunneling microscope |
1986 | Mono-atomic tips for scanning tunneling microscopy |
1986 | Near-field optical scanning microscopy with tunnel-distance regulation |
1986 | Scanning tunneling microscope automation |
1986 | Scanning tunneling microscopy of cleaved semiconductor surfaces |
1986 | Scanning tunneling microscopy of surface microstructure on rough surfaces |
1986 | Squeezable tunneling junctions |
1986 | STM activity at the University of Basel |
1986 | Surface modification with the scanning tunneling microscope |
1986 | Tunneling microscopy from 300 to 4.2 K |
1986 | Wide-range, low-operating-voltage, bimorph STM: Application as potentiometer |
1970 | Calculation of the Current Density in the Contacts of a Thin Film Resistor |
1965 | A Hard-Sphere Model to Simulate Alloy Thin Films |
1965 | Demagnetization of Flat Uniaxial Thin Films Under Hard Direction Drive |
1965 | Peculiar Domain Behavior in Thin, Magnetic Ni–Fe Double Films |
1964 | Effect of Temperature and Bias on Glass-Silicon Interfaces |
1964 | Electrochemical Phenomena in Thin Films of Silicon Dioxide on Silicon |
1964 | Nondestructive Determination of Thickness and Refractive Index of Transparent Films |
1963 | Magnetization of Uniaxial Cylindrical Thin Films |
1963 | Nonlinear Wave Propagation in a Transmission Line Loaded with Thin Permalloy Films |
1963 | Prenucleation of Lead Films with Copper, Gold, and Silver |
1962 | Analysis of Static and Quasidynamic Behavior of Magnetostatically Coupled Thin Magnetic Films |
1962 | Dependence of the Energy Gap in Superconductors on Position and Magnetic Field |
1962 | Determination of Lattice Strain and Crystallite Size in Thin Films |
1962 | Domain Wall Creeping in Thin Permalloy Films |
1962 | Partial-Switching Processes in Thin Magnetic Films |
1962 | Residual Stress in Single-Crystal Nickel Films |
1962 | Some Elementary Theoretical Considerations Concerning Superconductivity of Superimposed Metallic Films |
1962 | Static Reversal Processes in Thin Ni–Fe Films |
1960 | Analysis of the Residual Gases in Several Types of High-Vacuum Evaporators |
1960 | Angle-of-Incidence Anisotropy in Evaporated Nickel-Iron Films |
1960 | Anisotropic Conduction in Solids Near Surfaces |
1960 | Domain Walls in Thin Ni–Fe Films |
1960 | Electrical Properties of Thin-Film Semiconductors |
1960 | Magnetic Anisotropy in Single-Crystal Thin Films |
1960 | Measurement of Crystallite Size and Strain of Electroplated Films |
1960 | Measurement of Magnetic-Field Attenuation by Thin Superconducting Films |
1960 | Nanosecond Switching in Thin Magnetic Films |
1960 | On the Influence of Aggregation on the Magnetic Phase Transition of Evaporated Superconducting Thin Films |
1960 | Size Effects for Conduction in Thin Bismuth Crystals |
1960 | Space-Charge-Limited Currents in Resin Films |
1960 | Superconducting Tin Films of Low Residual Resistivity |
1960 | The Influence of Edge Effects on Domain Structure and Coercive Force of Circular Nickel-Iron Films |
1960 | The Variation of Cryotron Current Amplification Factor with Temperature |
1959 | Geometric Effects in the Superconducting Transition of Thin Films |
1959 | Millimicrosecond Magnetization Reversal in Thin Magnetic Films |