IBM Journal of Research and Development
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Related Papers
2005Microstructure and mechanical properties of lead-free solders and solder joints used in microelectronic applications
2002Challenges and future directions for the scaling of dynamic random-access memory (DRAM)
2002Process requirements for continued scaling of CMOS—the need and prospects for atomic-level manipulation
2000Characterization of constitutional liquid film migration in nickel-base alloy 718
2000Controlled collapse reflow chip joining
2000Reduction of electromigration in aluminum films by copper doping
2000The future of interconnection technology
1998Damascene copper electroplating for chip interconnections
1993Anodic dissolution of metals at high rates
1993Attachment of Solder Ball Connect (SBC) packages to circuit cards
1984Immersion tin: Its chemistry, metallurgy, and application in electronic packaging technology
1984Microstructure evolution during electroless copper deposition
1971A Design Study of Ultrasonic Bonding Tips
1970Indium-mercury Alloy as a Low-toxicity Liquid Electrode
1970Reduction of Electromigration in Aluminum Films by Copper Doping
1969Controlled Collapse Reflow Chip Joining
1969Geometric Optimization of Controlled Collapse Interconnections
1969Parametric Study of Temperature Profiles in Chips Joined by Controlled Collapse Techniques
1969Reliability of Controlled Collapse Interconnections
1969SLT Device Metallurgy and its Monolithic Extension
1969Studies of the SLT Chip Terminal Metallurgy
1968New Annealing Effects on the Bulk Corrosion Potential of Germanium
1967Precipitation of Phosphorus, Arsenic, and Boron in Thin Silicon Foils
1966Surface Attack in Chromium-Iron Alloys
1965Fatigue Strength of Case Hardened Steel Specimens Containing Through-The-Case Cracks
1965Sheet Thermoforming of a Superplastic Alloy
1963Prenucleation of Lead Films with Copper, Gold, and Silver
1962Direct Observations of the Substructure Network in Iron
1959Application of Phase-Contrast Metallography in a Production Laboratory
1957Microsectioning: A Metallographic Technique for Semiconductor Devices