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2006	Continuous MOSFET performance increase with device scaling: The role of strain and channel material innovations
2006	Optimizing CMOS technology for maximum performance
2006	Ultralow-voltage, minimum-energy CMOS
2003	SiON high-refractive-index waveguide and planar lightwave circuits
2000	Low-temperature Si and Si:Ge epitaxy by ultrahigh vacuum/chemical vapor deposition: Process fundamentals
2000	The future of CMOS technology
1999	Cost-effective cleaning and high-quality thin gate oxides
1999	Modeling and simulation methods for plasma processing
1999	Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations
1999	Plasma-assisted chemical vapor deposition of dielectric thin films for ULSI semiconductor circuits
1999	Plasma-assisted oxidation, anodization, and nitridation of silicon
1999	Plasma-etching processes for ULSI semiconductor circuits
1999	Plasma processing damage in etching and deposition
1999	Sputter deposition for semiconductor manufacturing
1995	A 64Kb × 32 DRAM for graphics applications
1995	A low-noise TTL-compatible CMOS off-chip driver circuit
1995	CMOS circuits for Gb/s serial data communication
1995	Custom design of CMOS low-power high-performance digital signal-processing macro for hard-disk-drive applications
1995	Design at the system level with VLSI CMOS
1995	Digital delay line clock shapers and multipliers
1995	Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines
1995	Interconnect fabrication processes and the development of low-cost wiring for CMOS products
1995	Low-temperature chemical vapor deposition processes and dielectrics for microelectronic circuit manufacturing at IBM
1995	Multipurpose DRAM architecture for optimal power, performance, and product flexibility
1995	Overview of gate linewidth control in the manufacture of CMOS logic chips
1995	Performance of fiber-optic data links using 670-nm cw VCSELs and a monolithic Si photodetector and CMOS preamplifier
1995	Silicides and local interconnections for high-performance VLSI applications
1995	The evolution of IBM CMOS DRAM technology
1995	VLSI on-chip interconnection performance simulations and measurements
1993	Flexible simulation of a complex semiconductor manufacturing line using a rule-based system
1992	A single-chip IBM System/390 floating-point processor in CMOS
1992	Advancing the state of the art in high-performance logic and array technology
1992	Directory and Trace memory chip with active discharge cell
1992	Reactive ion etching technology in thin-film-transistor processing
1992	Unique design concepts in GF11 and their impact on performance
1991	A 128Kb CMOS static random-access memory
1991	A 3072 × 32-stage TDI imaging device
1991	An adder design optimized for DCS logic
1991	Differential current switch-High performance at low power
1991	Visual interpretation of multidimensional computations and transistor design
1991	Visualization in a VLSI design automation system
1990	Low-temperature Si and Si:Ge epitaxy by ultrahigh-vacuum/chemical vapor deposition: Process fundamentals
1990	Selective epitaxial growth of silicon and some potential applications
1988	Physical limits to the useful packaging density of electronic systems
1988	The kinetics of fast steps on crystal surfaces and its application to the molecular beam epitaxy of silicon
1987	Contact metallurgy development for VLSI logic
1987	Correlation analysis of particle clusters on integrated circuit wafers
1987	Electrical and microstructural investigation of polysilicon emitter contacts for high-performance bipolar VLSI
1987	Study of contact and shallow junction characteristics in submicron CMOS with self-aligned titanium silicide
1986	On yield, fault distributions, and clustering of particles
1985	Advanced bipolar transistor modeling: Process and device simulation tools for today's technology
1985	An experimental comparison of the head/disk interface dynamics in 5¼- and 8-inch disk drives
1985	Animation and 3D color display of multiple-variable data: Application to semiconductor design
1985	FEDSS—A 2D semiconductor fabrication process simulator
1985	Semiconductor device simulation using generalized mobility models
1985	The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributions
1985	The generation of three-dimensional bipolar transistor models for circuit analysis
1985	Two-dimensional device simulation program: 2DP
1985	Two-dimensional process modeling: A description of the SAFEPRO program
1985	VLSI wiring capacitance
1984	Modeling of defects in integrated circuit photolithographic patterns
1984	Resist profile control in E-beam lithography
1982	Modification of Semiconductor Device Characteristics by Lasers
1982	Optimization of Plasma Processing for Silicon-Gate FET Manufacturing Applications
1982	Oxygen Incorporation and Precipitation in Czochralski-Grown Silicon
1982	Process Control of the Chlorobenzene Single-Step Liftoff Process with a Diazo-Type Resist
1982	The Mechanism of Single-Step Liftoff with Chlorobenzene in a Diazo-Type Resist
1981	A Magnetic Sensor Utilizing an Avalanching Semiconductor Device
1981	Semiconductor Analysis Using Finite Elements—Part I: Computational Aspects
1981	Semiconductor Logic Technology in IBM
1981	Semiconductor Manufacturing in IBM, 1957 to the Present: A Perspective
1981	Semiconductors at IBM: Physics, Novel Devices, and Materials Science
1981	Solid State Memory Development in IBM
1981	Statistics of Breakdown
1980	1/N Circuit and Device Technology
1980	A 256K-Bit Charge-Coupled Device Memory
1980	A 64K FET Dynamic Random Access Memory: Design Considerations and Description
1980	A Charge Injection Transistor Memory Cell
1980	A Contactless Method for High-Sensitivity Measurement of p-n Junction Leakage
1980	A One-Device Memory Cell Using a Single Layer of Polysilicon and a Self-Registering Metal-to-Polysilicon Contact
1980	A Silicon and Aluminum Dynamic Memory Technology
1980	Circuit Implementation of Fusible Redundant Addresses on RAMs for Productivity Enhancement
1980	Cross-Coupled Charge-Transfer Sense Amplifier and Latch Sense Scheme for High-Density FET Memories
1980	Defect-Related Breakdown and Conduction in SiO2
1980	Implanted Source/Drain Junctions for Polysilicon Gate Technologies
1980	Near-Ideal Si–SiO2 Interfaces
1980	Reduction of Leakage by Implantation Gettering in VLSI Circuits
1980	Registration Mark Detection for Electron-Beam Lithography—EL1 System
1980	Reliability of SiO2 Gate Dielectric with Semi-Recessed Oxide Isolation
1980	Silicon Torsional Scanning Mirror
1980	Single-Step Optical Lift-Off Process
1980	VLSI Device Phenomena in Dynamic Memory and Their Application to Technology Development and Device Design
1980	Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product
1979	GaAs/(GaAl)As Laser Technology
1979	Geometry Effects of Small MOSFET Devices
1979	Some Chemical Aspects of the Fluorocarbon Plasma Etching of Silicon and Its Compounds
1979	Stability of Lateral pnp Transistors During Accelerated Aging
1979	Tunnels in Semiconductor Epitaxy
1978	Calculations of the Effect of Emitter Compensation on β and fT of Bipolar Devices
1978	Characterization of Electron Traps in Aluminum-Implanted SiO2
1978	Electronic Properties of (100) Surfaces of GaSb and InAs and Their Alloys with GaAs
1978	Growth of Polycrystalline GaAs for Solar Cell Applications
1978	Location of Trapped Charge in Aluminum-Implanted SiO2
1978	Low Cost Silicon for Solar Energy Conversion Applications
1978	Novel Materials and Devices for Sunlight Concentrating Systems
1978	Variational Principles for Semiconductor Device Modeling with Finite Elements
1978	X-Ray Photoelectron Spectroscopy of SiO2–Si Interfacial Regions: Ultrathin Oxide Films
1973	Digital-to-analog Converter having Common-mode Isolation and Differential Output
1961	Theoretical Current Multiplication of a Cylindrical Hook Collector