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1993
Statistical modeling in manufacturing: Adapting a diagnostic tool to real-time applications
1989
Statistical properties of selected recording codes
1987
Correlation analysis of particle clusters on integrated circuit wafers
1987
Some aspects of the theory of statistical control schemes
1986
On yield, fault distributions, and clustering of particles
1985
The effects of wafer to wafer defect density variations on integrated circuit defect and fault distributions
1984
Optimizing Preventive Service of Software Products
1984
Statistical failure analysis of system timing
1983
On Murphy’s Yield Formula
1982
Regenerative Simulation of Networks of Queues with General Service Times: Passage Through Subnetworks
1981
Adaptive Spectral Methods for Simulation Output Analysis
1981
Design of Experiments in Computer Performance Evaluation
1970
On the Maximum Likelihood Method of Identification
1968
Method for Estimation and Optimization of Printer Speed Based on Character Usage Statistics
1968
The IBM SELECTRIC Composer: Statistical Evaluation of Printing Alignment
1964
A Statistical Approach to the Design of Diffused Junction Transistors
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