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IBM Journal of Research and Development  
Volume 34, Number 2/3, Page 406 (1990)
VLSI electrical testing
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Built-in self-test support in the IBM Engineering Design System

by B. L. Keller, T. J. Snethen
To evaluate the effectiveness of built-in self-test (BIST) for logic circuits, the test design automation (TDA) group within the IBM Engineering Design System (EDS) has developed tools to support BIST. This paper is an overview of that support. The specific hardware approaches taken are described briefly, and a short description is given of the major tools that have been developed and the methodology for using them. The performance of the system is shown for two sample circuits.
Related Subjects: Built-in self-test (BIST); Testing, chip; VLSI