IBM Journal of Research and Development
IBM Skip to main content
  Home     Products & services     Support & downloads     My account  

  Select a country  
Journals Home  
  Systems Journal  
Journal of Research
and Development
    Current Issue  
    Recent Issues  
    Papers in Progress  
    Search/Index  
    Orders  
    Description  
    Patents  
    Recent publications  
    Author's Guide  
  Staff  
  Contact Us  
  Related links:  
     IBM Research  

IBM Journal of Research and Development  
Volume 28, Number 2, Page 124 (1984)
Coding and Error Control
  Full article: arrowPDF   arrowCopyright info





   

Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review

by C. L. Chen, M. Y. Hsiao
This paper presents a state-of-the-art review of error-correcting codes for computer semiconductor memory applications. The construction of four classes of error-correcting codes appropriate for semiconductor memory designs is described, and for each class of codes the number of check bits required for commonly used data lengths is provided. The implementation aspects of error correction and error detection are also discussed, and certain algorithms useful in extending the error-correcting capability for the correction of soft errors such as α-particle-induced errors are examined in some detail.
Related Subjects: Error control and recovery; Error correction codes; Error detection and correction