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IBM Journal of Research and Development  
Volume 25, Number 4, Page 218 (1981)
Finite Element Analysis
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Finite-Element Analysis of Semiconductor Devices: The FIELDAY Program

by E. M. Buturla, P. E. Cottrell, B. M. Grossman, K. A. Salsburg
The FIELDAY program simulates semiconductor devices of arbitrary shape in one, two, or three dimensions operating under transient or steady-state conditions. A wide variety of physical effects, important in bipolar and field-effect transistors, can be modeled. The finite-element method transforms the continuum description of mobile carrier transport in a semiconductor device to a simulation model at a discrete number of points. Coupled and decoupled algorithms offer two methods of linearizing the differential equations. Direct techniques are used to solve the resulting matrix equations. Pre- and post-processors enable users to rapidly generate new models and analyze results. Specific examples illustrate the flexibility and accuracy of FIELDAY.
Related Subjects: Algorithms; Analytical models; Models and modeling; Semiconductor devices