IBM Journal of Research and Development
IBM Skip to main content
  Home     Products & services     Support & downloads     My account  

  Select a country  
Journals Home  
  Systems Journal  
Journal of Research
and Development
    Current Issue  
    Recent Issues  
    Papers in Progress  
    Search/Index  
    Orders  
    Description  
    Patents  
    Recent publications  
    Author's Guide  
  Staff  
  Contact Us  
  Related links:  
     IBM Research  

IBM Journal of Research and Development  
Volume 30, Number 5, Page 553 (1986)
Scanning Tunneling Microscopy II
  Full article: arrowPDF   arrowCopyright info





   

The behavior and calibration of some piezoelectric ceramics used in the STM

by S. Vieira
The high resolution and displacement measurement in the scanning tunneling microscope are dependent upon the behavior of the piezoelectric ceramics used for moving the tip. In this paper certain characteristics and features of piezoelectric ceramics relevant to the desired precision are discussed. These characteristics are the relaxation aftereffects that follow the change of the applied electric field, and the temperature dependence of the piezoelectric response. The above effects have been analyzed in four commercial piezoelectric ceramics by the three-terminal capacitance measurement technique.
Related Subjects: Ceramics